Research paper
Experimental GrowthExperimental Characterization| Type | Label | Value | Material | Sample | Condition | Source |
|---|---|---|---|---|---|---|
| Stoichiometric Ratio | Cr:Te ratio | close to 1 | — | |||
| Stoichiometric Ratio | Cr:Te ratio | close to 18 | — | |||
| Crystal Orientation Fraction | epitaxially oriented grains | 0.7 | — | |||
| Mosaic Spread | ΔΦ | 14.48deg | — | |||
| Curie Temperature | TC | 180K | — | |||
| Curie Temperature | TC | 240-250K | — | |||
| Magnetic Anisotropy | magnetic anisotropy | perpendicular | — | |||
| Magnetic Anisotropy | magnetic anisotropy | in-plane | — | |||
| Thickness | film thickness | 6.1nm | — | |||
| Annealing Stability Temperature | stable up to | 650°C | — | |||
| Degradation Temperature | Te evaporation / pure Cr formation onset | 700°C | — |
| Type | Label | Value | Material | Sample | Condition | Source |
|---|---|---|---|---|---|---|
| Stoichiometric Ratio | Cr:Te ratio | close to 1 | — | |||
| Stoichiometric Ratio | Cr:Te ratio | close to 18 | — | |||
| Crystal Orientation Fraction | epitaxially oriented grains | 0.7 | — | |||
| Mosaic Spread | ΔΦ | 14.48deg | — | |||
| Curie Temperature | TC | 180K | — | |||
| Curie Temperature | TC | 240-250K | — | |||
| Magnetic Anisotropy | magnetic anisotropy | perpendicular | — | |||
| Magnetic Anisotropy | magnetic anisotropy | in-plane | — | |||
| Thickness | film thickness | 6.1nm | — | |||
| Annealing Stability Temperature | stable up to | 650°C | — | |||
| Degradation Temperature | Te evaporation / pure Cr formation onset | 700°C | — |
| Type | Label | Value | Material | Sample | Condition | Source |
|---|---|---|---|---|---|---|
| Stoichiometric Ratio | Cr:Te ratio | close to 1 | — | |||
| Stoichiometric Ratio | Cr:Te ratio | close to 18 | — | |||
| Crystal Orientation Fraction | epitaxially oriented grains | 0.7 | — | |||
| Mosaic Spread | ΔΦ | 14.48deg | — | |||
| Curie Temperature | TC | 180K | — | |||
| Curie Temperature | TC | 240-250K | — | |||
| Magnetic Anisotropy | magnetic anisotropy | perpendicular | — | |||
| Magnetic Anisotropy | magnetic anisotropy | in-plane | — | |||
| Thickness | film thickness | 6.1nm | — | |||
| Annealing Stability Temperature | stable up to | 650°C | — | |||
| Degradation Temperature | Te evaporation / pure Cr formation onset | 700°C | — |
| Type | Label | Value | Material | Sample | Condition | Source |
|---|---|---|---|---|---|---|
| Stoichiometric Ratio | Cr:Te ratio | close to 1 | — | |||
| Stoichiometric Ratio | Cr:Te ratio | close to 18 | — | |||
| Crystal Orientation Fraction | epitaxially oriented grains | 0.7 | — | |||
| Mosaic Spread | ΔΦ | 14.48deg | — | |||
| Curie Temperature | TC | 180K | — | |||
| Curie Temperature | TC | 240-250K | — | |||
| Magnetic Anisotropy | magnetic anisotropy | perpendicular | — | |||
| Magnetic Anisotropy | magnetic anisotropy | in-plane | — | |||
| Thickness | film thickness | 6.1nm | — | |||
| Annealing Stability Temperature | stable up to | 650°C | — | |||
| Degradation Temperature | Te evaporation / pure Cr formation onset | 700°C | — |