Research paper
Experimental GrowthExperimental CharacterizationEach sample groups how it was prepared, characterized, and measured. Click a card to expand.
1 preparation1 characterization5 properties1 figure
1 preparation1 characterization5 properties1 figure
1 preparation1 characterization5 properties1 figure
1 preparation1 characterization5 properties1 figure
1 preparation1 characterization5 properties1 figure
1 preparation1 characterization5 properties1 figure
2 preparations
1 preparation1 characterization4 properties
| Type | Label | Value | Material | Sample | Condition | Source |
|---|---|---|---|---|---|---|
| Transport Critical Temperature | Tc | 4.4K | — | |||
| Transport Critical Temperature | Tc | 4.9K | — | |||
| Transport Critical Temperature | Tc | 5.1K | — | |||
| Transport Critical Temperature | Tc | 3.6K | — | |||
| Transport Critical Temperature | Tc | 4.2K | — | |||
| Transport Critical Temperature | Tc | 4.7K | — | |||
| Critical Temperature Fit Parameter | Tco | 6.71K | — | |||
| Critical Thickness Fit Parameter | dc | 1.38nm | — | |||
| Critical Temperature Fit Parameter | Tco | 6.79K | — | |||
| Critical Thickness Fit Parameter | dc | 1.87nm | — | |||
| Critical Temperature Fit Parameter | Tco | 6.22K | — | |||
| Dimensionless Fit Parameter | gamma | 7.4 | — | |||
| Critical Temperature Fit Parameter | Tco | 6.82K | — | |||
| Dimensionless Fit Parameter | gamma | 8.35 | — | |||
| Timing Jitter | SNSPD timing jitter | 50ps | — | |||
| Recovery Time | SNSPD recovery time | 29ns | — | |||
| Operating Temperature | SNSPD plateau condition | 2.2K | — | |||
| Operating Wavelength | SNSPD plateau condition | 980nm | — |
Related documents with shared materials, methods, properties, or citations.
GaN EPITAXIAL GROWTH METHOD
Signatures of correlated defects in an ultra-clean Wigner crystal in the extreme quantum limit
METHOD FOR TRANSFERRING COMPOUND SEMICONDUCTOR SINGLE CRYSTAL THIN FILM LAYER AND METHOD FOR PREPARING SINGLE CRYSTAL GaAs-OI COMPOSITE WAFER
Ultrafast dynamics of carriers, coherent acoustic phonons and strain pulses in BiSbTe1.5Se1.5 topological insulator thin films
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Each sample groups how it was prepared, characterized, and measured. Click a card to expand.
1 preparation1 characterization5 properties1 figure
1 preparation1 characterization5 properties1 figure
1 preparation1 characterization5 properties1 figure
1 preparation1 characterization5 properties1 figure
1 preparation1 characterization5 properties1 figure
1 preparation1 characterization5 properties1 figure
2 preparations
1 preparation1 characterization4 properties
| Type | Label | Value | Material | Sample | Condition | Source |
|---|---|---|---|---|---|---|
| Transport Critical Temperature | Tc | 4.4K | — | |||
| Transport Critical Temperature | Tc | 4.9K | — | |||
| Transport Critical Temperature | Tc | 5.1K | — | |||
| Transport Critical Temperature | Tc | 3.6K | — | |||
| Transport Critical Temperature | Tc | 4.2K | — | |||
| Transport Critical Temperature | Tc | 4.7K | — | |||
| Critical Temperature Fit Parameter | Tco | 6.71K | — | |||
| Critical Thickness Fit Parameter | dc | 1.38nm | — | |||
| Critical Temperature Fit Parameter | Tco | 6.79K | — | |||
| Critical Thickness Fit Parameter | dc | 1.87nm | — | |||
| Critical Temperature Fit Parameter | Tco | 6.22K | — | |||
| Dimensionless Fit Parameter | gamma | 7.4 | — | |||
| Critical Temperature Fit Parameter | Tco | 6.82K | — | |||
| Dimensionless Fit Parameter | gamma | 8.35 | — | |||
| Timing Jitter | SNSPD timing jitter | 50ps | — | |||
| Recovery Time | SNSPD recovery time | 29ns | — | |||
| Operating Temperature | SNSPD plateau condition | 2.2K | — | |||
| Operating Wavelength | SNSPD plateau condition | 980nm | — |
Related documents with shared materials, methods, properties, or citations.
GaN EPITAXIAL GROWTH METHOD
Signatures of correlated defects in an ultra-clean Wigner crystal in the extreme quantum limit
METHOD FOR TRANSFERRING COMPOUND SEMICONDUCTOR SINGLE CRYSTAL THIN FILM LAYER AND METHOD FOR PREPARING SINGLE CRYSTAL GaAs-OI COMPOSITE WAFER
Ultrafast dynamics of carriers, coherent acoustic phonons and strain pulses in BiSbTe1.5Se1.5 topological insulator thin films
Silicon-based Josephson junction field-effect transistors enabling cryogenic logic and quantum technologies
Doubling of the superconducting transition temperature in ultra-clean wafer-scale aluminum nanofilms
External busbars for improving current generation in multijunction solar cells
Phosphides-based terahertz quantum-cascade laser
Entropic signatures of the single-impurity Kondo state
Multi-Segment Photonic Power Converters for Energy Harvesting and High-Speed Optical Wireless Communication
Ion-Beam-Sputtered Mid-Infrared Coatings for Hybrid Supermirrors
Each sample groups how it was prepared, characterized, and measured. Click a card to expand.
1 preparation1 characterization5 properties1 figure
1 preparation1 characterization5 properties1 figure
1 preparation1 characterization5 properties1 figure
1 preparation1 characterization5 properties1 figure
1 preparation1 characterization5 properties1 figure
1 preparation1 characterization5 properties1 figure
2 preparations
1 preparation1 characterization4 properties
| Type | Label | Value | Material | Sample | Condition | Source |
|---|---|---|---|---|---|---|
| Transport Critical Temperature | Tc | 4.4K | — | |||
| Transport Critical Temperature | Tc | 4.9K | — | |||
| Transport Critical Temperature | Tc | 5.1K | — | |||
| Transport Critical Temperature | Tc | 3.6K | — | |||
| Transport Critical Temperature | Tc | 4.2K | — | |||
| Transport Critical Temperature | Tc | 4.7K | — | |||
| Critical Temperature Fit Parameter | Tco | 6.71K | — | |||
| Critical Thickness Fit Parameter | dc | 1.38nm | — | |||
| Critical Temperature Fit Parameter | Tco | 6.79K | — | |||
| Critical Thickness Fit Parameter | dc | 1.87nm | — | |||
| Critical Temperature Fit Parameter | Tco | 6.22K | — | |||
| Dimensionless Fit Parameter | gamma | 7.4 | — | |||
| Critical Temperature Fit Parameter | Tco | 6.82K | — | |||
| Dimensionless Fit Parameter | gamma | 8.35 | — | |||
| Timing Jitter | SNSPD timing jitter | 50ps | — | |||
| Recovery Time | SNSPD recovery time | 29ns | — | |||
| Operating Temperature | SNSPD plateau condition | 2.2K | — | |||
| Operating Wavelength | SNSPD plateau condition | 980nm | — |
Related documents with shared materials, methods, properties, or citations.
GaN EPITAXIAL GROWTH METHOD
Signatures of correlated defects in an ultra-clean Wigner crystal in the extreme quantum limit
METHOD FOR TRANSFERRING COMPOUND SEMICONDUCTOR SINGLE CRYSTAL THIN FILM LAYER AND METHOD FOR PREPARING SINGLE CRYSTAL GaAs-OI COMPOSITE WAFER
Ultrafast dynamics of carriers, coherent acoustic phonons and strain pulses in BiSbTe1.5Se1.5 topological insulator thin films
Silicon-based Josephson junction field-effect transistors enabling cryogenic logic and quantum technologies
Doubling of the superconducting transition temperature in ultra-clean wafer-scale aluminum nanofilms
External busbars for improving current generation in multijunction solar cells
Phosphides-based terahertz quantum-cascade laser
Entropic signatures of the single-impurity Kondo state
Multi-Segment Photonic Power Converters for Energy Harvesting and High-Speed Optical Wireless Communication
Ion-Beam-Sputtered Mid-Infrared Coatings for Hybrid Supermirrors
Each sample groups how it was prepared, characterized, and measured. Click a card to expand.
1 preparation1 characterization5 properties1 figure
1 preparation1 characterization5 properties1 figure
1 preparation1 characterization5 properties1 figure
1 preparation1 characterization5 properties1 figure
1 preparation1 characterization5 properties1 figure
1 preparation1 characterization5 properties1 figure
2 preparations
1 preparation1 characterization4 properties
| Type | Label | Value | Material | Sample | Condition | Source |
|---|---|---|---|---|---|---|
| Transport Critical Temperature | Tc | 4.4K | — | |||
| Transport Critical Temperature | Tc | 4.9K | — | |||
| Transport Critical Temperature | Tc | 5.1K | — | |||
| Transport Critical Temperature | Tc | 3.6K | — | |||
| Transport Critical Temperature | Tc | 4.2K | — | |||
| Transport Critical Temperature | Tc | 4.7K | — | |||
| Critical Temperature Fit Parameter | Tco | 6.71K | — | |||
| Critical Thickness Fit Parameter | dc | 1.38nm | — | |||
| Critical Temperature Fit Parameter | Tco | 6.79K | — | |||
| Critical Thickness Fit Parameter | dc | 1.87nm | — | |||
| Critical Temperature Fit Parameter | Tco | 6.22K | — | |||
| Dimensionless Fit Parameter | gamma | 7.4 | — | |||
| Critical Temperature Fit Parameter | Tco | 6.82K | — | |||
| Dimensionless Fit Parameter | gamma | 8.35 | — | |||
| Timing Jitter | SNSPD timing jitter | 50ps | — | |||
| Recovery Time | SNSPD recovery time | 29ns | — | |||
| Operating Temperature | SNSPD plateau condition | 2.2K | — | |||
| Operating Wavelength | SNSPD plateau condition | 980nm | — |
Related documents with shared materials, methods, properties, or citations.
GaN EPITAXIAL GROWTH METHOD
Signatures of correlated defects in an ultra-clean Wigner crystal in the extreme quantum limit
METHOD FOR TRANSFERRING COMPOUND SEMICONDUCTOR SINGLE CRYSTAL THIN FILM LAYER AND METHOD FOR PREPARING SINGLE CRYSTAL GaAs-OI COMPOSITE WAFER
Ultrafast dynamics of carriers, coherent acoustic phonons and strain pulses in BiSbTe1.5Se1.5 topological insulator thin films
Silicon-based Josephson junction field-effect transistors enabling cryogenic logic and quantum technologies
Doubling of the superconducting transition temperature in ultra-clean wafer-scale aluminum nanofilms
External busbars for improving current generation in multijunction solar cells
Phosphides-based terahertz quantum-cascade laser
Entropic signatures of the single-impurity Kondo state
Multi-Segment Photonic Power Converters for Energy Harvesting and High-Speed Optical Wireless Communication
Ion-Beam-Sputtered Mid-Infrared Coatings for Hybrid Supermirrors