Each sample groups how it was prepared, characterized, and measured. Click a card to expand.
74-nm-thick epitaxial Fe₃Si film grown on piezoelectric GaAs(001), patterned into cross-shaped structures with interdigital transducers for SAW experiments.
Each sample groups how it was prepared, characterized, and measured. Click a card to expand.
74-nm-thick epitaxial Fe₃Si film grown on piezoelectric GaAs(001), patterned into cross-shaped structures with interdigital transducers for SAW experiments.
Each sample groups how it was prepared, characterized, and measured. Click a card to expand.
74-nm-thick epitaxial Fe₃Si film grown on piezoelectric GaAs(001), patterned into cross-shaped structures with interdigital transducers for SAW experiments.
Each sample groups how it was prepared, characterized, and measured. Click a card to expand.
74-nm-thick epitaxial Fe₃Si film grown on piezoelectric GaAs(001), patterned into cross-shaped structures with interdigital transducers for SAW experiments.