Research paper
Experimental GrowthExperimental CharacterizationEach sample groups how it was prepared, characterized, and measured. Click a card to expand.
2 preparations5 characterizations3 properties2 figures
2 preparations6 characterizations15 properties4 figures
2 preparations6 characterizations14 properties4 figures
2 preparations1 characterization3 properties1 figure
1 preparation2 characterizations5 properties3 figures
| Type | Label | Value | Material | Sample | Condition | Source |
|---|---|---|---|---|---|---|
| Raman Peak | A1g | 257cm⁻¹ | — | |||
| Raman Peak | E12g | 253cm⁻¹ | — | |||
| Raman Peak | VSe₂-related mode | 197cm⁻¹ | — | |||
| Raman Peak Shift | E12g redshift | 5cm⁻¹ | — | |||
| Raman Peak Shift | E12g redshift | 6cm⁻¹ | — | |||
| Raman Peak Fwhm | E12g | 7.08cm⁻¹ | — | |||
| Raman Peak Fwhm | E12g | 8.87cm⁻¹ | — | |||
| Xrd Peak Intensity | qualitative RBS result | Se peak appears after selenization; confirms conversion | — | |||
| Areal Density | W | 2510¹² atoms/cm² | — | |||
| Areal Density | V | 5.210¹² atoms/cm² | — | |||
| Areal Density | Se | 5710¹² atoms/cm² | — | |||
| Composition Fraction | x in W₁-xVxSe₂ | 0.172 | — | |||
| Film Thickness | WSe₂ film thickness | 15nm | — | |||
| Areal Density | W | 2010¹² atoms/cm² | — | |||
| Areal Density | V | 9.210¹² atoms/cm² | — | |||
| Areal Density | Se | 55.510¹² atoms/cm² | — | |||
| Composition Fraction | x in W₁-xVxSe₂ | 0.315 | — | |||
| Film Thickness | W₁-xVxSe₂ film thickness | 16nm | — | |||
| Atomic Percent | V content | 6.2% | — | |||
| Atomic Percent | V content | 3.3% | — | |||
| Fet On Off Ratio | Id enhancement vs undoped WSe₂ | approximately three orders of magnitude increase in drain current | — | |||
| Fet Mobility | qualitative transport | p-type behavior observed; mobility not explicitly reported | — | |||
| Fet On Off Ratio | maximum photoconductive gain | 30% | — | |||
| Fet On Off Ratio | maximum photoconductive gain | 8% | — | |||
| Fet On Off Ratio | maximum photoconductive gain | almost negligible | — | |||
| Xps Binding Energy | W 4f7/2 | 31.88eV | — | |||
| Xps Binding Energy | W 4f5/2 | 34.04eV | — | |||
| Xps Binding Energy | Se 3d5/2 | 54.56eV | — | — | ||
| Xps Binding Energy | Se 3d3/2 | 55.42eV | — | — | ||
| Xps Binding Energy | Se 3d5/2 | 54.34eV | — | — | ||
| Xps Binding Energy | Se 3d3/2 | 55.2eV | — | — | ||
| Xps Binding Energy | V 2p3/2 | 514eV | — | |||
| Xps Binding Energy | V 2p1/2 | 521.2eV | — | |||
| Xps Binding Energy Shift | W 4f7/2 | 0.32eV | — | |||
| Xps Binding Energy | O 1s | 538eV | — | |||
| Xps Atomic Fraction | — | 35.0486at.% | — | |||
| Xps Atomic Fraction | — | 61.6524at.% | — | |||
| Xps Atomic Fraction | — | 3.299at.% | — | |||
| Xps Atomic Fraction | — | 33.585at.% | — | |||
| Xps Atomic Fraction | — | 60.2017at.% | — | |||
| Xps Atomic Fraction | — | 6.21332at.% | — |
Related documents with shared materials, methods, properties, or citations.
Growth of Large Area WSe2 and Observation of Photogenerated Inversion Layer in DMOS Configuration
Distinguishing different stackings in WSe2 bilayers grown Using Chemical Vapor Deposition
Resonant Tunneling in Tri-layer 2H-MoTe2 grown by Molecular Beam Epitaxy Coupled with layered WSe2 carrier Reservoir
Impact of Disorder Dynamics and Multi-Domain Kinetics on the Sliding Ferroelectricity of CVD-Grown 3R-WSe2 Bilayers
The Defects Genome of Janus Transition Metal Dichalcogenides
Toward Mass-Production of Transition Metal Dichalcogenide Solar Cells: Scalable Growth of Photovoltaic-Grade Multilayer WSe2 by Tungsten Selenization
Low Resistance P-Type Contacts to Monolayer WSe2 through Chlorinated Solvent Doping
Wafer-scale robust graphene electronics under industrial processing conditions
Each sample groups how it was prepared, characterized, and measured. Click a card to expand.
2 preparations5 characterizations3 properties2 figures
2 preparations6 characterizations15 properties4 figures
2 preparations6 characterizations14 properties4 figures
2 preparations1 characterization3 properties1 figure
1 preparation2 characterizations5 properties3 figures
| Type | Label | Value | Material | Sample | Condition | Source |
|---|---|---|---|---|---|---|
| Raman Peak | A1g | 257cm⁻¹ | — | |||
| Raman Peak | E12g | 253cm⁻¹ | — | |||
| Raman Peak | VSe₂-related mode | 197cm⁻¹ | — | |||
| Raman Peak Shift | E12g redshift | 5cm⁻¹ | — | |||
| Raman Peak Shift | E12g redshift | 6cm⁻¹ | — | |||
| Raman Peak Fwhm | E12g | 7.08cm⁻¹ | — | |||
| Raman Peak Fwhm | E12g | 8.87cm⁻¹ | — | |||
| Xrd Peak Intensity | qualitative RBS result | Se peak appears after selenization; confirms conversion | — | |||
| Areal Density | W | 2510¹² atoms/cm² | — | |||
| Areal Density | V | 5.210¹² atoms/cm² | — | |||
| Areal Density | Se | 5710¹² atoms/cm² | — | |||
| Composition Fraction | x in W₁-xVxSe₂ | 0.172 | — | |||
| Film Thickness | WSe₂ film thickness | 15nm | — | |||
| Areal Density | W | 2010¹² atoms/cm² | — | |||
| Areal Density | V | 9.210¹² atoms/cm² | — | |||
| Areal Density | Se | 55.510¹² atoms/cm² | — | |||
| Composition Fraction | x in W₁-xVxSe₂ | 0.315 | — | |||
| Film Thickness | W₁-xVxSe₂ film thickness | 16nm | — | |||
| Atomic Percent | V content | 6.2% | — | |||
| Atomic Percent | V content | 3.3% | — | |||
| Fet On Off Ratio | Id enhancement vs undoped WSe₂ | approximately three orders of magnitude increase in drain current | — | |||
| Fet Mobility | qualitative transport | p-type behavior observed; mobility not explicitly reported | — | |||
| Fet On Off Ratio | maximum photoconductive gain | 30% | — | |||
| Fet On Off Ratio | maximum photoconductive gain | 8% | — | |||
| Fet On Off Ratio | maximum photoconductive gain | almost negligible | — | |||
| Xps Binding Energy | W 4f7/2 | 31.88eV | — | |||
| Xps Binding Energy | W 4f5/2 | 34.04eV | — | |||
| Xps Binding Energy | Se 3d5/2 | 54.56eV | — | — | ||
| Xps Binding Energy | Se 3d3/2 | 55.42eV | — | — | ||
| Xps Binding Energy | Se 3d5/2 | 54.34eV | — | — | ||
| Xps Binding Energy | Se 3d3/2 | 55.2eV | — | — | ||
| Xps Binding Energy | V 2p3/2 | 514eV | — | |||
| Xps Binding Energy | V 2p1/2 | 521.2eV | — | |||
| Xps Binding Energy Shift | W 4f7/2 | 0.32eV | — | |||
| Xps Binding Energy | O 1s | 538eV | — | |||
| Xps Atomic Fraction | — | 35.0486at.% | — | |||
| Xps Atomic Fraction | — | 61.6524at.% | — | |||
| Xps Atomic Fraction | — | 3.299at.% | — | |||
| Xps Atomic Fraction | — | 33.585at.% | — | |||
| Xps Atomic Fraction | — | 60.2017at.% | — | |||
| Xps Atomic Fraction | — | 6.21332at.% | — |
Related documents with shared materials, methods, properties, or citations.
Growth of Large Area WSe2 and Observation of Photogenerated Inversion Layer in DMOS Configuration
Distinguishing different stackings in WSe2 bilayers grown Using Chemical Vapor Deposition
Resonant Tunneling in Tri-layer 2H-MoTe2 grown by Molecular Beam Epitaxy Coupled with layered WSe2 carrier Reservoir
Impact of Disorder Dynamics and Multi-Domain Kinetics on the Sliding Ferroelectricity of CVD-Grown 3R-WSe2 Bilayers
The Defects Genome of Janus Transition Metal Dichalcogenides
Toward Mass-Production of Transition Metal Dichalcogenide Solar Cells: Scalable Growth of Photovoltaic-Grade Multilayer WSe2 by Tungsten Selenization
Low Resistance P-Type Contacts to Monolayer WSe2 through Chlorinated Solvent Doping
Wafer-scale robust graphene electronics under industrial processing conditions
Each sample groups how it was prepared, characterized, and measured. Click a card to expand.
2 preparations5 characterizations3 properties2 figures
2 preparations6 characterizations15 properties4 figures
2 preparations6 characterizations14 properties4 figures
2 preparations1 characterization3 properties1 figure
1 preparation2 characterizations5 properties3 figures
| Type | Label | Value | Material | Sample | Condition | Source |
|---|---|---|---|---|---|---|
| Raman Peak | A1g | 257cm⁻¹ | — | |||
| Raman Peak | E12g | 253cm⁻¹ | — | |||
| Raman Peak | VSe₂-related mode | 197cm⁻¹ | — | |||
| Raman Peak Shift | E12g redshift | 5cm⁻¹ | — | |||
| Raman Peak Shift | E12g redshift | 6cm⁻¹ | — | |||
| Raman Peak Fwhm | E12g | 7.08cm⁻¹ | — | |||
| Raman Peak Fwhm | E12g | 8.87cm⁻¹ | — | |||
| Xrd Peak Intensity | qualitative RBS result | Se peak appears after selenization; confirms conversion | — | |||
| Areal Density | W | 2510¹² atoms/cm² | — | |||
| Areal Density | V | 5.210¹² atoms/cm² | — | |||
| Areal Density | Se | 5710¹² atoms/cm² | — | |||
| Composition Fraction | x in W₁-xVxSe₂ | 0.172 | — | |||
| Film Thickness | WSe₂ film thickness | 15nm | — | |||
| Areal Density | W | 2010¹² atoms/cm² | — | |||
| Areal Density | V | 9.210¹² atoms/cm² | — | |||
| Areal Density | Se | 55.510¹² atoms/cm² | — | |||
| Composition Fraction | x in W₁-xVxSe₂ | 0.315 | — | |||
| Film Thickness | W₁-xVxSe₂ film thickness | 16nm | — | |||
| Atomic Percent | V content | 6.2% | — | |||
| Atomic Percent | V content | 3.3% | — | |||
| Fet On Off Ratio | Id enhancement vs undoped WSe₂ | approximately three orders of magnitude increase in drain current | — | |||
| Fet Mobility | qualitative transport | p-type behavior observed; mobility not explicitly reported | — | |||
| Fet On Off Ratio | maximum photoconductive gain | 30% | — | |||
| Fet On Off Ratio | maximum photoconductive gain | 8% | — | |||
| Fet On Off Ratio | maximum photoconductive gain | almost negligible | — | |||
| Xps Binding Energy | W 4f7/2 | 31.88eV | — | |||
| Xps Binding Energy | W 4f5/2 | 34.04eV | — | |||
| Xps Binding Energy | Se 3d5/2 | 54.56eV | — | — | ||
| Xps Binding Energy | Se 3d3/2 | 55.42eV | — | — | ||
| Xps Binding Energy | Se 3d5/2 | 54.34eV | — | — | ||
| Xps Binding Energy | Se 3d3/2 | 55.2eV | — | — | ||
| Xps Binding Energy | V 2p3/2 | 514eV | — | |||
| Xps Binding Energy | V 2p1/2 | 521.2eV | — | |||
| Xps Binding Energy Shift | W 4f7/2 | 0.32eV | — | |||
| Xps Binding Energy | O 1s | 538eV | — | |||
| Xps Atomic Fraction | — | 35.0486at.% | — | |||
| Xps Atomic Fraction | — | 61.6524at.% | — | |||
| Xps Atomic Fraction | — | 3.299at.% | — | |||
| Xps Atomic Fraction | — | 33.585at.% | — | |||
| Xps Atomic Fraction | — | 60.2017at.% | — | |||
| Xps Atomic Fraction | — | 6.21332at.% | — |
Related documents with shared materials, methods, properties, or citations.
Growth of Large Area WSe2 and Observation of Photogenerated Inversion Layer in DMOS Configuration
Distinguishing different stackings in WSe2 bilayers grown Using Chemical Vapor Deposition
Resonant Tunneling in Tri-layer 2H-MoTe2 grown by Molecular Beam Epitaxy Coupled with layered WSe2 carrier Reservoir
Impact of Disorder Dynamics and Multi-Domain Kinetics on the Sliding Ferroelectricity of CVD-Grown 3R-WSe2 Bilayers
The Defects Genome of Janus Transition Metal Dichalcogenides
Toward Mass-Production of Transition Metal Dichalcogenide Solar Cells: Scalable Growth of Photovoltaic-Grade Multilayer WSe2 by Tungsten Selenization
Low Resistance P-Type Contacts to Monolayer WSe2 through Chlorinated Solvent Doping
Wafer-scale robust graphene electronics under industrial processing conditions
Each sample groups how it was prepared, characterized, and measured. Click a card to expand.
2 preparations5 characterizations3 properties2 figures
2 preparations6 characterizations15 properties4 figures
2 preparations6 characterizations14 properties4 figures
2 preparations1 characterization3 properties1 figure
1 preparation2 characterizations5 properties3 figures
| Type | Label | Value | Material | Sample | Condition | Source |
|---|---|---|---|---|---|---|
| Raman Peak | A1g | 257cm⁻¹ | — | |||
| Raman Peak | E12g | 253cm⁻¹ | — | |||
| Raman Peak | VSe₂-related mode | 197cm⁻¹ | — | |||
| Raman Peak Shift | E12g redshift | 5cm⁻¹ | — | |||
| Raman Peak Shift | E12g redshift | 6cm⁻¹ | — | |||
| Raman Peak Fwhm | E12g | 7.08cm⁻¹ | — | |||
| Raman Peak Fwhm | E12g | 8.87cm⁻¹ | — | |||
| Xrd Peak Intensity | qualitative RBS result | Se peak appears after selenization; confirms conversion | — | |||
| Areal Density | W | 2510¹² atoms/cm² | — | |||
| Areal Density | V | 5.210¹² atoms/cm² | — | |||
| Areal Density | Se | 5710¹² atoms/cm² | — | |||
| Composition Fraction | x in W₁-xVxSe₂ | 0.172 | — | |||
| Film Thickness | WSe₂ film thickness | 15nm | — | |||
| Areal Density | W | 2010¹² atoms/cm² | — | |||
| Areal Density | V | 9.210¹² atoms/cm² | — | |||
| Areal Density | Se | 55.510¹² atoms/cm² | — | |||
| Composition Fraction | x in W₁-xVxSe₂ | 0.315 | — | |||
| Film Thickness | W₁-xVxSe₂ film thickness | 16nm | — | |||
| Atomic Percent | V content | 6.2% | — | |||
| Atomic Percent | V content | 3.3% | — | |||
| Fet On Off Ratio | Id enhancement vs undoped WSe₂ | approximately three orders of magnitude increase in drain current | — | |||
| Fet Mobility | qualitative transport | p-type behavior observed; mobility not explicitly reported | — | |||
| Fet On Off Ratio | maximum photoconductive gain | 30% | — | |||
| Fet On Off Ratio | maximum photoconductive gain | 8% | — | |||
| Fet On Off Ratio | maximum photoconductive gain | almost negligible | — | |||
| Xps Binding Energy | W 4f7/2 | 31.88eV | — | |||
| Xps Binding Energy | W 4f5/2 | 34.04eV | — | |||
| Xps Binding Energy | Se 3d5/2 | 54.56eV | — | — | ||
| Xps Binding Energy | Se 3d3/2 | 55.42eV | — | — | ||
| Xps Binding Energy | Se 3d5/2 | 54.34eV | — | — | ||
| Xps Binding Energy | Se 3d3/2 | 55.2eV | — | — | ||
| Xps Binding Energy | V 2p3/2 | 514eV | — | |||
| Xps Binding Energy | V 2p1/2 | 521.2eV | — | |||
| Xps Binding Energy Shift | W 4f7/2 | 0.32eV | — | |||
| Xps Binding Energy | O 1s | 538eV | — | |||
| Xps Atomic Fraction | — | 35.0486at.% | — | |||
| Xps Atomic Fraction | — | 61.6524at.% | — | |||
| Xps Atomic Fraction | — | 3.299at.% | — | |||
| Xps Atomic Fraction | — | 33.585at.% | — | |||
| Xps Atomic Fraction | — | 60.2017at.% | — | |||
| Xps Atomic Fraction | — | 6.21332at.% | — |
Related documents with shared materials, methods, properties, or citations.
Growth of Large Area WSe2 and Observation of Photogenerated Inversion Layer in DMOS Configuration
Distinguishing different stackings in WSe2 bilayers grown Using Chemical Vapor Deposition
Resonant Tunneling in Tri-layer 2H-MoTe2 grown by Molecular Beam Epitaxy Coupled with layered WSe2 carrier Reservoir
Impact of Disorder Dynamics and Multi-Domain Kinetics on the Sliding Ferroelectricity of CVD-Grown 3R-WSe2 Bilayers
The Defects Genome of Janus Transition Metal Dichalcogenides
Toward Mass-Production of Transition Metal Dichalcogenide Solar Cells: Scalable Growth of Photovoltaic-Grade Multilayer WSe2 by Tungsten Selenization
Low Resistance P-Type Contacts to Monolayer WSe2 through Chlorinated Solvent Doping
Wafer-scale robust graphene electronics under industrial processing conditions