Research paper
Experimental CharacterizationTheoretical| Type | Label | Value | Material | Sample | Condition | Source |
|---|---|---|---|---|---|---|
| Substrate Thickness | InP slab thickness | 520nm | — | |||
| Layer Thickness | QW etching depth | 17nm | — | |||
| Substrate Thickness | InGaAsP slab thickness | 530nm | — | |||
| PL Peak | TM lasing peak | 1534nm | — | |||
| PL Peak | TM lasing peak | 1594nm | — | |||
| Optical Mode Wavelength | calculated TM cavity mode wavelength | 1555nm | — | |||
| Quality Factor | calculated TM cavity mode Q-factor | 160000 | — | |||
| Quality Factor | optimized TM cavity Q-factor | 2000000 | — |
| Type | Label | Value | Material | Sample | Condition | Source |
|---|---|---|---|---|---|---|
| Substrate Thickness | InP slab thickness | 520nm | — | |||
| Layer Thickness | QW etching depth | 17nm | — | |||
| Substrate Thickness | InGaAsP slab thickness | 530nm | — | |||
| PL Peak | TM lasing peak | 1534nm | — | |||
| PL Peak | TM lasing peak | 1594nm | — | |||
| Optical Mode Wavelength | calculated TM cavity mode wavelength | 1555nm | — | |||
| Quality Factor | calculated TM cavity mode Q-factor | 160000 | — | |||
| Quality Factor | optimized TM cavity Q-factor | 2000000 | — |
| Type | Label | Value | Material | Sample | Condition | Source |
|---|---|---|---|---|---|---|
| Substrate Thickness | InP slab thickness | 520nm | — | |||
| Layer Thickness | QW etching depth | 17nm | — | |||
| Substrate Thickness | InGaAsP slab thickness | 530nm | — | |||
| PL Peak | TM lasing peak | 1534nm | — | |||
| PL Peak | TM lasing peak | 1594nm | — | |||
| Optical Mode Wavelength | calculated TM cavity mode wavelength | 1555nm | — | |||
| Quality Factor | calculated TM cavity mode Q-factor | 160000 | — | |||
| Quality Factor | optimized TM cavity Q-factor | 2000000 | — |
| Type | Label | Value | Material | Sample | Condition | Source |
|---|---|---|---|---|---|---|
| Substrate Thickness | InP slab thickness | 520nm | — | |||
| Layer Thickness | QW etching depth | 17nm | — | |||
| Substrate Thickness | InGaAsP slab thickness | 530nm | — | |||
| PL Peak | TM lasing peak | 1534nm | — | |||
| PL Peak | TM lasing peak | 1594nm | — | |||
| Optical Mode Wavelength | calculated TM cavity mode wavelength | 1555nm | — | |||
| Quality Factor | calculated TM cavity mode Q-factor | 160000 | — | |||
| Quality Factor | optimized TM cavity Q-factor | 2000000 | — |