Patent
US 9,093,509gate insulating layer/gate oxide
silicon oxide
SiO₂
FIG. 5 is a graph illustrating a performance curve of a field effect transistor according to at least one example embodiment; [0017]
distance between nanoholes | 1–20 nm | C |
gate insulating layer (silicon oxide) thickness | 100–300 nm | SiO₂ |
Thickness | 5–30 nm | — |
Thickness | ≤ 1 nm | — |
Thickness | ≥ 20 nm | — |
gate insulating layer/gate oxide
silicon oxide
SiO₂
FIG. 5 is a graph illustrating a performance curve of a field effect transistor according to at least one example embodiment; [0017]
distance between nanoholes | 1–20 nm | C |
gate insulating layer (silicon oxide) thickness | 100–300 nm | SiO₂ |
Thickness | 5–30 nm | — |
Thickness | ≤ 1 nm | — |
Thickness | ≥ 20 nm | — |
gate insulating layer/gate oxide
silicon oxide
SiO₂
FIG. 5 is a graph illustrating a performance curve of a field effect transistor according to at least one example embodiment; [0017]
distance between nanoholes | 1–20 nm | C |
gate insulating layer (silicon oxide) thickness | 100–300 nm | SiO₂ |
Thickness | 5–30 nm | — |
Thickness | ≤ 1 nm | — |
Thickness | ≥ 20 nm | — |
gate insulating layer/gate oxide
silicon oxide
SiO₂
FIG. 5 is a graph illustrating a performance curve of a field effect transistor according to at least one example embodiment; [0017]
distance between nanoholes | 1–20 nm | C |
gate insulating layer (silicon oxide) thickness | 100–300 nm | SiO₂ |
Thickness | 5–30 nm | — |
Thickness | ≤ 1 nm | — |
Thickness | ≥ 20 nm | — |