Research paper
Experimental GrowthExperimental Characterization| Type | Label | Value | Material | Sample | Condition | Source |
|---|---|---|---|---|---|---|
| Substrate Thickness | GaAs quantum well thickness | 14nm | — | |||
| Channel Width | channel width | 5um | — | |||
| Channel Length | channel length | 100um | — | |||
| Sheet Carrier Density | electron density | 910000000000cm⁻² | — | |||
| Fet Mobility | electron mobility | 2000000cm²/Vs | — | |||
| PL Peak | X | 1.5153eV | — | |||
| PL Peak | DX center | 1.5141eV | — | |||
| PL Peak | doublet splitting | 2meV | — | |||
| PL Peak | critical current | 75uA | — | |||
| PL Peak | critical current | 53uA | — | |||
| Pl Peak Fwhm | PL peak | 1meV | — | — | — | |
| Pl Peak Fwhm | PL peak | 2meV | — | — | — |
| Type | Label | Value | Material | Sample | Condition | Source |
|---|---|---|---|---|---|---|
| Substrate Thickness | GaAs quantum well thickness | 14nm | — | |||
| Channel Width | channel width | 5um | — | |||
| Channel Length | channel length | 100um | — | |||
| Sheet Carrier Density | electron density | 910000000000cm⁻² | — | |||
| Fet Mobility | electron mobility | 2000000cm²/Vs | — | |||
| PL Peak | X | 1.5153eV | — | |||
| PL Peak | DX center | 1.5141eV | — | |||
| PL Peak | doublet splitting | 2meV | — | |||
| PL Peak | critical current | 75uA | — | |||
| PL Peak | critical current | 53uA | — | |||
| Pl Peak Fwhm | PL peak | 1meV | — | — | — | |
| Pl Peak Fwhm | PL peak | 2meV | — | — | — |
| Type | Label | Value | Material | Sample | Condition | Source |
|---|---|---|---|---|---|---|
| Substrate Thickness | GaAs quantum well thickness | 14nm | — | |||
| Channel Width | channel width | 5um | — | |||
| Channel Length | channel length | 100um | — | |||
| Sheet Carrier Density | electron density | 910000000000cm⁻² | — | |||
| Fet Mobility | electron mobility | 2000000cm²/Vs | — | |||
| PL Peak | X | 1.5153eV | — | |||
| PL Peak | DX center | 1.5141eV | — | |||
| PL Peak | doublet splitting | 2meV | — | |||
| PL Peak | critical current | 75uA | — | |||
| PL Peak | critical current | 53uA | — | |||
| Pl Peak Fwhm | PL peak | 1meV | — | — | — | |
| Pl Peak Fwhm | PL peak | 2meV | — | — | — |
| Type | Label | Value | Material | Sample | Condition | Source |
|---|---|---|---|---|---|---|
| Substrate Thickness | GaAs quantum well thickness | 14nm | — | |||
| Channel Width | channel width | 5um | — | |||
| Channel Length | channel length | 100um | — | |||
| Sheet Carrier Density | electron density | 910000000000cm⁻² | — | |||
| Fet Mobility | electron mobility | 2000000cm²/Vs | — | |||
| PL Peak | X | 1.5153eV | — | |||
| PL Peak | DX center | 1.5141eV | — | |||
| PL Peak | doublet splitting | 2meV | — | |||
| PL Peak | critical current | 75uA | — | |||
| PL Peak | critical current | 53uA | — | |||
| Pl Peak Fwhm | PL peak | 1meV | — | — | — | |
| Pl Peak Fwhm | PL peak | 2meV | — | — | — |