Research paper
Experimental GrowthExperimental Characterization| Type | Label | Value | Material | Sample | Condition | Source |
|---|---|---|---|---|---|---|
| Substrate Thickness | GaAs quantum well thickness | 14nm | — | |||
| Fet Carrier Concentration | sheet electron density | 910000000000cm⁻² | — | |||
| Fet Mobility | electron mobility | 2000000cm²/Vs | — | |||
| PL Peak | HH₀ | 1.55eV | — | |||
| PL Peak | HH₁ | 1.54eV | — | |||
| PL Peak | LH₀ | 1.53eV | — | |||
| PL Peak | XLH and X+LH | double PL line: exciton/trion | — | |||
| PL Peak | Hall voltage drop | 0.6V | — | |||
| PL Peak | residual Hall voltage | 0.003V | — | |||
| PL Peak | hole diffusion length | 5-10um | — |
| Type | Label | Value | Material | Sample | Condition | Source |
|---|---|---|---|---|---|---|
| Substrate Thickness | GaAs quantum well thickness | 14nm | — | |||
| Fet Carrier Concentration | sheet electron density | 910000000000cm⁻² | — | |||
| Fet Mobility | electron mobility | 2000000cm²/Vs | — | |||
| PL Peak | HH₀ | 1.55eV | — | |||
| PL Peak | HH₁ | 1.54eV | — | |||
| PL Peak | LH₀ | 1.53eV | — | |||
| PL Peak | XLH and X+LH | double PL line: exciton/trion | — | |||
| PL Peak | Hall voltage drop | 0.6V | — | |||
| PL Peak | residual Hall voltage | 0.003V | — | |||
| PL Peak | hole diffusion length | 5-10um | — |
| Type | Label | Value | Material | Sample | Condition | Source |
|---|---|---|---|---|---|---|
| Substrate Thickness | GaAs quantum well thickness | 14nm | — | |||
| Fet Carrier Concentration | sheet electron density | 910000000000cm⁻² | — | |||
| Fet Mobility | electron mobility | 2000000cm²/Vs | — | |||
| PL Peak | HH₀ | 1.55eV | — | |||
| PL Peak | HH₁ | 1.54eV | — | |||
| PL Peak | LH₀ | 1.53eV | — | |||
| PL Peak | XLH and X+LH | double PL line: exciton/trion | — | |||
| PL Peak | Hall voltage drop | 0.6V | — | |||
| PL Peak | residual Hall voltage | 0.003V | — | |||
| PL Peak | hole diffusion length | 5-10um | — |
| Type | Label | Value | Material | Sample | Condition | Source |
|---|---|---|---|---|---|---|
| Substrate Thickness | GaAs quantum well thickness | 14nm | — | |||
| Fet Carrier Concentration | sheet electron density | 910000000000cm⁻² | — | |||
| Fet Mobility | electron mobility | 2000000cm²/Vs | — | |||
| PL Peak | HH₀ | 1.55eV | — | |||
| PL Peak | HH₁ | 1.54eV | — | |||
| PL Peak | LH₀ | 1.53eV | — | |||
| PL Peak | XLH and X+LH | double PL line: exciton/trion | — | |||
| PL Peak | Hall voltage drop | 0.6V | — | |||
| PL Peak | residual Hall voltage | 0.003V | — | |||
| PL Peak | hole diffusion length | 5-10um | — |